Description

About the job

 

DFT resource with 8+ yrs experience.

 

  • Strong background and experience with Scan design, Clock architecture, ATPG methodology and industry standard tools
  • Worked on Test compressions and decompression scan methodology generating test patterns at block and SoC level.
  • Worked on ATPG test pattern generation stuck-at and at-speed with depth fault coverage analysis identifying issues to meet the coverage targets.
  • Worked on boundary Scan test plan, test coverage with JTAG
  • Understand MBIST concepts and insertion and test the integration at partition and SoC level.
  • Understand the concept of memory redundancy logic.
  • Understand JTAG concepts with all jtag IEEE standards
  • Worked on industry standard DFT tools
  • Strong knowledge on scripting in TCL/Perl/Python.
  • Must possess good communication skills, be a self-driven individual and a good team player

 

Key Skills
Education

Any Graduate